• DocumentCode
    2712497
  • Title

    Optical properties of Au and Pt-doped PLT 28 films

  • Author

    Teowee, G. ; McCarthy, K.C. ; Bukowski, T.J. ; Alexander, T.P. ; Motakef, S. ; Uhlmann, D.R.

  • Author_Institution
    Donnelly Corp., Tucson, AZ, USA
  • Volume
    2
  • fYear
    1996
  • fDate
    18-21 Aug 1996
  • Firstpage
    671
  • Abstract
    Metal colloid-doped oxides yield potentially interesting non-linear optical properties especially third order non-linearity which is expected to be enhanced in oxide matrices with high values of dielectric constant or refractive index. La-doped PbTiO3 (i.e. PLT 28) films, incorporated with 0.05 to 2 mole % Au and Pt, were obtained using sol-gel deposition techniques. The films were spincoated on Corning 7059 glass substrates and fired at 400°C-600°C. The films were then subjected to optical characterization, namely transmission and absorbance spectroscopy. PLT films doped with Au appeared bluish which turned deeper with higher Au concentration or higher firing temperatures. Additionally, the absorbance peak (near 650 nm) shifted to shorter wavelengths with higher metal colloid contents but shifted to longer wavelengths at higher firing temperatures. The waveguiding loss in the Pt-doped films ranged from 2-3 dB/cm
  • Keywords
    colloids; gold; lanthanum compounds; lead compounds; optical films; optical losses; platinum; refractive index; sol-gel processing; visible spectra; 400 to 600 C; PLT film; PbLaTiO3:Au; PbLaTiO3:Pt; absorbance spectroscopy; dielectric constant; firing; metal colloid-doped oxide; optical properties; refractive index; sol-gel deposition; spin coating; third order nonlinearity; transmission spectroscopy; waveguiding loss; Firing; Gold; High-K gate dielectrics; Nonlinear optics; Optical films; Optical refraction; Optical variables control; Refractive index; Temperature; Transmission line matrix methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 1996. ISAF '96., Proceedings of the Tenth IEEE International Symposium on
  • Conference_Location
    East Brunswick, NJ
  • Print_ISBN
    0-7803-3355-1
  • Type

    conf

  • DOI
    10.1109/ISAF.1996.598107
  • Filename
    598107