Two-Tone Signal Generation for Communication Application ADC Testing

Author

Kato, Keisuke ; Abe, Fumitaka ; Wakabayashi, Kazuyuki ; Gao, Chuan ; Yamada, Takafumi ; Kobayashi, Haruo ; Kobayashi, Osamu ; Niitsu, Kiichi

Author_Institution

Dept. of Electron. Eng., Gunma Univ., Kiryu, Japan

fYear

2012

fDate

19-22 Nov. 2012

Firstpage

179

Lastpage

184

Abstract

This paper describes algorithms for generating low intermodulation-distortion (IMD) two-tone sinewaves, for communication application ADC testing, using an arbitrary waveform generator (AWG) or a multi-bit ΣΔ DAC inside an SoC. The nonlinearity of the DAC generates distortion components, and we propose here eight methods to precompensate for the IMD using DSP algorithms and produce low-IMD two-tone signals. Theoretical analysis, simulation, and experimental results all demonstrate the effectiveness of our approach.

Keywords

digital signal processing chips; digital-analogue conversion; intermodulation distortion; sigma-delta modulation; system-on-chip; DSP algorithms; SoC; arbitrary waveform generator; communication application ADC testing; low intermodulation-distortion; low-IMD two-tone signals; multibit ΣΔ DAC; precompensate; two-tone signal generation; two-tone sinewaves; ADC Testing; Arbitrary Waveform Generator S?DAC; Digital Pre-Distortion; Distortion Shaping; Intermodulation Distortion; Two-Tone Signal;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium (ATS), 2012 IEEE 21st Asian

Conference_Location

Niigata

ISSN

1081-7735

Print_ISBN

978-1-4673-4555-2

Electronic_ISBN

1081-7735

Type

conf

DOI

10.1109/ATS.2012.12

Filename

6394196