• DocumentCode
    2713833
  • Title

    Hard and soft lead zirconate titanate thin films deposited on flat and curved surfaces by pulsed laser deposition

  • Author

    Lacey, Johanna ; Trolier-McKinstry, Susan

  • Author_Institution
    Intercoll. Mater. Res. Lab., Pennsylvania State Univ., University Park, PA, USA
  • Volume
    2
  • fYear
    1996
  • fDate
    18-21 Aug 1996
  • Firstpage
    687
  • Abstract
    Lead zirconate titanate thin films offer considerably larger piezoelectric coefficients than do ZnO, and so are attractive for microelectromechanical sensors and actuators. To date, much of the research in this field has concentrated on undoped PZT. In this work, PZT films grown from both hard and soft PZT targets have been deposited on flat surfaces and on fibers by pulsed laser deposition so that the effect of doping on the properties can be determined. Dielectric constant and loss values of 1500 and 0.01 for soft films and 1100 and 0.03 for hard films have been achieved on flat Pt coated Si substrates with no observable difference in coercive fields. Remnant polarizations are typically 30 μC/cm2 for both types of films. A fiber rotator has been designed and employed to deposit films on fibers 50 μm and larger
  • Keywords
    dielectric losses; fibres; lead compounds; permittivity; piezoceramics; piezoelectric thin films; pulsed laser deposition; PZT; PZT thin film; PbZrO3TiO3; Pt coated Si substrate; coercive field; curved surface; dielectric constant; dielectric loss; doping; fiber rotator; flat surface; hard target; microelectromechanical actuator; microelectromechanical sensor; piezoelectric coefficient; pulsed laser deposition; remnant polarization; soft target; Optical fiber polarization; Piezoelectric actuators; Piezoelectric films; Pulsed laser deposition; Semiconductor films; Sputtering; Surface emitting lasers; Thin film sensors; Titanium compounds; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 1996. ISAF '96., Proceedings of the Tenth IEEE International Symposium on
  • Conference_Location
    East Brunswick, NJ
  • Print_ISBN
    0-7803-3355-1
  • Type

    conf

  • DOI
    10.1109/ISAF.1996.598114
  • Filename
    598114