DocumentCode
2714523
Title
Modeling Large Screens via Homogenization with the Finite Element Method
Author
Bardi, Istvan ; Vogel, Martin ; Cendes, Zoltan J.
Author_Institution
Ansoft Corp., Pittsburgh, PA
fYear
2006
fDate
11-16 June 2006
Firstpage
1315
Lastpage
1318
Abstract
The finite element method (FEM) is applied to calculate the screening effect of electromagnetic radiation through screens with periodic perforations. In this procedure, screens of large extent with complex but periodic geometry are replaced during the FEM simulation by sheets representing anisotropic impedance boundary conditions. The homogenized anisotropic impedance boundary conditions are calculated from a single unit cell of the screen by using the finite element method. The FEM is modified to handle the new anisotropic impedance boundary condition. Replacing large screens with an impedance boundary condition reduces the size of the finite element mesh and allows more complex structures to be simulated. While the procedure is approximate, it does provide good accuracy to determine levels of EMC/EMI radiation in complex electronic equipment. The method is applied to compute the radiation emanating from a real-life electronic printed circuit board enclosed in a real-life computer cabinet
Keywords
electromagnetic compatibility; electromagnetic interference; electromagnetic shielding; finite element analysis; EMC radiation; EMI radiation; FEM simulation; anisotropic impedance boundary conditions; electromagnetic radiation; electronic printed circuit board; finite element method; periodic perforations; screening effect; single unit cell; Anisotropic magnetoresistance; Boundary conditions; Circuit simulation; Computational modeling; Electromagnetic compatibility; Electromagnetic radiation; Finite element methods; Geometry; Impedance; Solid modeling; EMC/EMI; Finite Element Method; anisotropic impedance boundary condition; homogenization; periodic structures; screening;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 2006. IEEE MTT-S International
Conference_Location
San Francisco, CA
ISSN
0149-645X
Print_ISBN
0-7803-9541-7
Electronic_ISBN
0149-645X
Type
conf
DOI
10.1109/MWSYM.2006.249472
Filename
4015165
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