• DocumentCode
    2714523
  • Title

    Modeling Large Screens via Homogenization with the Finite Element Method

  • Author

    Bardi, Istvan ; Vogel, Martin ; Cendes, Zoltan J.

  • Author_Institution
    Ansoft Corp., Pittsburgh, PA
  • fYear
    2006
  • fDate
    11-16 June 2006
  • Firstpage
    1315
  • Lastpage
    1318
  • Abstract
    The finite element method (FEM) is applied to calculate the screening effect of electromagnetic radiation through screens with periodic perforations. In this procedure, screens of large extent with complex but periodic geometry are replaced during the FEM simulation by sheets representing anisotropic impedance boundary conditions. The homogenized anisotropic impedance boundary conditions are calculated from a single unit cell of the screen by using the finite element method. The FEM is modified to handle the new anisotropic impedance boundary condition. Replacing large screens with an impedance boundary condition reduces the size of the finite element mesh and allows more complex structures to be simulated. While the procedure is approximate, it does provide good accuracy to determine levels of EMC/EMI radiation in complex electronic equipment. The method is applied to compute the radiation emanating from a real-life electronic printed circuit board enclosed in a real-life computer cabinet
  • Keywords
    electromagnetic compatibility; electromagnetic interference; electromagnetic shielding; finite element analysis; EMC radiation; EMI radiation; FEM simulation; anisotropic impedance boundary conditions; electromagnetic radiation; electronic printed circuit board; finite element method; periodic perforations; screening effect; single unit cell; Anisotropic magnetoresistance; Boundary conditions; Circuit simulation; Computational modeling; Electromagnetic compatibility; Electromagnetic radiation; Finite element methods; Geometry; Impedance; Solid modeling; EMC/EMI; Finite Element Method; anisotropic impedance boundary condition; homogenization; periodic structures; screening;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2006. IEEE MTT-S International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-9541-7
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2006.249472
  • Filename
    4015165