DocumentCode
2715422
Title
The Study of Design for Testability on Analog Circuit Based on Boundary-Scan
Author
Lin, Haijun ; Hou, Zelong ; Yao, Fu ; Xuhui, Zhang
Author_Institution
Sch. of Meas.-Control Technol. & Commun. Eng., Harbin Univ. Of Sci. & Technol., Harbin, China
fYear
2012
fDate
11-13 Aug. 2012
Firstpage
195
Lastpage
198
Abstract
Based on the analysis of the IEEE 1149.4 Std for a Mixed-Signal Test Bus, this paper analyzed the working and use principle of STA400 that supports the IEEE1149.4 Std in detail. Then this paper proposed constructive view on its use in design for testability on analog circuits, which has practical significance to the use of IEEE1149.4 Std.
Keywords
IEEE standards; analogue circuits; boundary scan testing; mixed analogue-digital integrated circuits; IEEE 1149.4 Std; IEEE1149.4 Std; STA400; analog circuit; boundary-scan; mixed-signal test bus; testability; Analog circuits; Design for testability; Monitoring; Multiplexing; Probes; Switches; analog circuits; boundary-scan; mixed-signal; testability;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Science & Service System (CSSS), 2012 International Conference on
Conference_Location
Nanjing
Print_ISBN
978-1-4673-0721-5
Type
conf
DOI
10.1109/CSSS.2012.56
Filename
6394295
Link To Document