• DocumentCode
    2716763
  • Title

    A 10-b 500MS/s CMOS cascaded folding A/D converter with a hybrid calibration and a prevision error correction logic

  • Author

    Han, Junbum ; Choi, Donggwi ; Kim, Kyungtae ; Kim, Daeyun ; Song, Minkyu

  • Author_Institution
    Dept. of Semicond. Sci., Dongguk Univ-Seoul, Seoul, South Korea
  • fYear
    2011
  • fDate
    26-29 June 2011
  • Firstpage
    313
  • Lastpage
    316
  • Abstract
    In this paper, a 10-b 500 MS/s A/D converter (ADC) with a hybrid calibration and a new error correction logic is discussed. The proposed ADC employs a single-channel cascaded folding-interpolating architecture whose folding rate (FR) is 25 and interpolation rate (IR) is 8. In order to overcome the disadvantage of offset error, at the open-loop amplifier, a hybrid self-calibration circuit is proposed. Further, a novel prevision digital error correction logic (DCL) for folding ADC is also described. The ADC prototype using 130 nm 1P6M CMOS has a DNL of ±0.8 LSB and an INL of ±1.0 LSB. The measured SNDR is 52.34-dB and SFDR is 62.04-dBc when the input frequency is 78.15 MHz at 500 MS/s conversion rate. The SNDR of the ADC is 7-dB higher than the same circuit without the proposed calibration. The effective chip area is 1.55 mm and the power dissipates 300 mW including peripheral circuits at 1.2/1.5 V power supply.
  • Keywords
    CMOS integrated circuits; amplifiers; analogue-digital conversion; calibration; ADC; CMOS; CMOS cascaded folding A/D converter; DCL; FR; IR; digital error correction logic; folding rate; frequency 78.15 MHz; gain 52.34 dB; gain 7 dB; hybrid self-calibration circuit; interpolation rate; open-loop amplifier; power 300 mW; single-channel cascaded folding-interpolating architecture; size 130 nm; voltage 1.2 V; voltage 1.5 V; word length 10 bit; Binary codes; CMOS integrated circuits; Calibration; Computer architecture; Error correction; Frequency measurement; Solid state circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    New Circuits and Systems Conference (NEWCAS), 2011 IEEE 9th International
  • Conference_Location
    Bordeaux
  • Print_ISBN
    978-1-61284-135-9
  • Type

    conf

  • DOI
    10.1109/NEWCAS.2011.5981318
  • Filename
    5981318