DocumentCode
2717181
Title
Neighborhood repulsed metric learning for kinship verification
Author
Lu, Jiwen ; Hu, Junlin ; Zhou, Xiuzhuang ; Shang, Yuanyuan ; Tan, Yap-Peng ; Wang, Gang
Author_Institution
Adv. Digital Sci. Center, Singapore, Singapore
fYear
2012
fDate
16-21 June 2012
Firstpage
2594
Lastpage
2601
Abstract
Kinship verification from facial images is a challenging problem in computer vision, and there is a very few attempts on tackling this problem in the literature. In this paper, we propose a new neighborhood repulsed metric learning (NRML) method for kinship verification. Motivated by the fact that interclass samples (without kinship relations) with higher similarity usually lie in a neighborhood and are more easily misclassified than those with lower similarity, we aim to learn a distance metric under which the intraclass samples (with kinship relations) are pushed as close as possible and interclass samples lying in a neighborhood are repulsed and pulled as far as possible, simultaneously, such that more discriminative information can be exploited for verification. Moreover, we propose a multiview NRM-L (MNRML) method to seek a common distance metric to make better use of multiple feature descriptors to further improve the verification performance. Experimental results are presented to demonstrate the efficacy of the proposed methods.
Keywords
computer vision; face recognition; learning (artificial intelligence); computer vision; distance metric; facial images; interclass samples; intraclass samples; kinship verification; multiview NRM-L; neighborhood repulsed metric learning; Eigenvalues and eigenfunctions; Extraterrestrial measurements; Face; Face recognition; Optimization; Training;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition (CVPR), 2012 IEEE Conference on
Conference_Location
Providence, RI
ISSN
1063-6919
Print_ISBN
978-1-4673-1226-4
Electronic_ISBN
1063-6919
Type
conf
DOI
10.1109/CVPR.2012.6247978
Filename
6247978
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