• DocumentCode
    2717432
  • Title

    Modified Rational Function Modeling Technique for High Speed Circuits

  • Author

    Zeng, Robert X. ; Sinsky, Jeffrey H.

  • Author_Institution
    MathWorks, Inc., Natick, MA
  • fYear
    2006
  • fDate
    11-16 June 2006
  • Firstpage
    1951
  • Lastpage
    1954
  • Abstract
    This paper presents a modified rational function modeling technique for high speed circuits. It models the scattering parameters (S-parameters) of high speed circuits with modified rational functions. S-parameters can be directly measured or simulated using traditional circuit simulation tools, and the poles and residues of modified rational functions are determined by a vector fitting algorithm. Compared to the traditional rational functions, far fewer poles are needed. With the modified rational functions, the time-domain-reflectometry, time-domain-transmission waveforms and output signals of high speed circuits can be easily expressed in closed-forms, providing a simple way to do quasi-analytic time domain analysis of measured microwave structures. The presented modeling technique is demonstrated for a differential transmission channel on a high-speed electrical backplane
  • Keywords
    S-parameters; curve fitting; network analysis; poles and zeros; rational functions; time-domain analysis; time-domain reflectometry; S-parameters modeling; circuit simulation tools; differential transmission channel; digital transmission; frequency response; high speed circuits; high-speed electrical backplane; microwave measurements; microwave structures; modified rational function modeling; time domain analysis; time-domain-reflectometry; vector fitting algorithm; Backplanes; Circuit simulation; Delay effects; Frequency; Microwave circuits; Microwave measurements; Scattering parameters; Time domain analysis; Time measurement; USA Councils; Digital transmission; circuit modeling; differential analyzers; frequency response; microwave measurements; rational functions; scattering parameters; signal integrity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2006. IEEE MTT-S International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-9541-7
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2006.249816
  • Filename
    4015341