DocumentCode
2717432
Title
Modified Rational Function Modeling Technique for High Speed Circuits
Author
Zeng, Robert X. ; Sinsky, Jeffrey H.
Author_Institution
MathWorks, Inc., Natick, MA
fYear
2006
fDate
11-16 June 2006
Firstpage
1951
Lastpage
1954
Abstract
This paper presents a modified rational function modeling technique for high speed circuits. It models the scattering parameters (S-parameters) of high speed circuits with modified rational functions. S-parameters can be directly measured or simulated using traditional circuit simulation tools, and the poles and residues of modified rational functions are determined by a vector fitting algorithm. Compared to the traditional rational functions, far fewer poles are needed. With the modified rational functions, the time-domain-reflectometry, time-domain-transmission waveforms and output signals of high speed circuits can be easily expressed in closed-forms, providing a simple way to do quasi-analytic time domain analysis of measured microwave structures. The presented modeling technique is demonstrated for a differential transmission channel on a high-speed electrical backplane
Keywords
S-parameters; curve fitting; network analysis; poles and zeros; rational functions; time-domain analysis; time-domain reflectometry; S-parameters modeling; circuit simulation tools; differential transmission channel; digital transmission; frequency response; high speed circuits; high-speed electrical backplane; microwave measurements; microwave structures; modified rational function modeling; time domain analysis; time-domain-reflectometry; vector fitting algorithm; Backplanes; Circuit simulation; Delay effects; Frequency; Microwave circuits; Microwave measurements; Scattering parameters; Time domain analysis; Time measurement; USA Councils; Digital transmission; circuit modeling; differential analyzers; frequency response; microwave measurements; rational functions; scattering parameters; signal integrity;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 2006. IEEE MTT-S International
Conference_Location
San Francisco, CA
ISSN
0149-645X
Print_ISBN
0-7803-9541-7
Electronic_ISBN
0149-645X
Type
conf
DOI
10.1109/MWSYM.2006.249816
Filename
4015341
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