DocumentCode
2718565
Title
Electric and ferroelectric properties of Pb(Zr0.2Ti0.8)O3 thin films deposited by pulsed laser deposition on single crystalline substrates
Author
Pintilie, L. ; Lisca, M. ; Alexe, M.
Author_Institution
Nat. Inst. of Mater. Phys., Bucharest, Romania
Volume
2
fYear
2004
fDate
4-6 Oct. 2004
Firstpage
415
Abstract
Epitaxial Pb(Zr0.2Ti0.8)O3 (PZT) thin films were grown on single crystalline Nb-doped SrTiO3 (STON) substrates by pulsed laser deposition (PLD). The top electrode was SrRuO3. The investigated electric and ferroelectric properties have revealed a strong asymmetry of the two PZT-electrode interfaces. A qualitative explanation based on the possible existence of a n+-p junction at the STON-PZT interface is suggested.
Keywords
Schottky barriers; dielectric hysteresis; dielectric polarisation; ferroelectric capacitors; ferroelectric thin films; lead compounds; p-n junctions; semiconductor epitaxial layers; wide band gap semiconductors; PZT; PZT thin films; PZT-SrRuO3-Pt; PZT-electrode interface asymmetry; Pb(Zr0.2Ti0.8)O3 thin films; PbZrO3TiO3; PbZrO3TiO3-SrRuO3-Pt; SrTiO3:Nb; electric properties; ferroelectric properties; n-p junction; pulsed laser deposition; single crystalline Nb-doped SrTiO3 substrates; single crystalline substrates; Crystal microstructure; Crystallization; Dielectric thin films; Electrodes; Ferroelectric materials; Optical pulses; Pulsed laser deposition; Sputtering; Substrates; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Conference, 2004. CAS 2004 Proceedings. 2004 International
Print_ISBN
0-7803-8499-7
Type
conf
DOI
10.1109/SMICND.2004.1403034
Filename
1403034
Link To Document