DocumentCode
2722549
Title
Environmentally friendly dry de-smear of fine-via by ultra high density nonequilibrium atmospheric pressure plasma
Author
Iwata, Yoshiyuki ; Sakamoto, Hajime ; Takeda, Keigo ; Hori, Masaru
Author_Institution
IBIDEN Co., Ltd., Ogaki, Japan
fYear
2012
fDate
May 29 2012-June 1 2012
Firstpage
647
Lastpage
650
Abstract
A new approach of de-smearing fine via bottom residue is proposed in this study for high density package substrate manufacturing. 60 Hz nonequilibrium atmospheric pressure plasma was used as the plasma source, and perfluoromethyl vinylether (PMVE) was used as reactive gas for the dry de-smear evaluation. It was found that 2.0% of PMVE mixing ratio to the discharge gas (Argon) was enough to remove the via bottom residue including resin and silica filler. 60 Hz nonequilibrium atmospheric pressure plasma is vacuum chamber free and does not require high cost voltage source. The global warming potential (GWP) of PMVE is very low. Therefore, this approach is expected to be low cost and environmentally friendly dry de-smear technology for fine via of high density package substrate of next advanced generation.
Keywords
environmental factors; integrated circuit packaging; plasma materials processing; surface cleaning; PMVE; discharge gas; environmentally friendly fine via dry desmear; fine via bottom residue desmearing; fine via of high density package substrate; global warming potential; high density package substrate manufacturing; nonequilibrium atmospheric pressure plasma; perfluoromethyl vinylether; plasma source; reactive gas; ultra high density nonequilibrium plasma; Argon; Discharges (electric); Optical mixing; Optical variables measurement; Plasmas; Stimulated emission; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
Conference_Location
San Diego, CA
ISSN
0569-5503
Print_ISBN
978-1-4673-1966-9
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2012.6248900
Filename
6248900
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