• DocumentCode
    2722549
  • Title

    Environmentally friendly dry de-smear of fine-via by ultra high density nonequilibrium atmospheric pressure plasma

  • Author

    Iwata, Yoshiyuki ; Sakamoto, Hajime ; Takeda, Keigo ; Hori, Masaru

  • Author_Institution
    IBIDEN Co., Ltd., Ogaki, Japan
  • fYear
    2012
  • fDate
    May 29 2012-June 1 2012
  • Firstpage
    647
  • Lastpage
    650
  • Abstract
    A new approach of de-smearing fine via bottom residue is proposed in this study for high density package substrate manufacturing. 60 Hz nonequilibrium atmospheric pressure plasma was used as the plasma source, and perfluoromethyl vinylether (PMVE) was used as reactive gas for the dry de-smear evaluation. It was found that 2.0% of PMVE mixing ratio to the discharge gas (Argon) was enough to remove the via bottom residue including resin and silica filler. 60 Hz nonequilibrium atmospheric pressure plasma is vacuum chamber free and does not require high cost voltage source. The global warming potential (GWP) of PMVE is very low. Therefore, this approach is expected to be low cost and environmentally friendly dry de-smear technology for fine via of high density package substrate of next advanced generation.
  • Keywords
    environmental factors; integrated circuit packaging; plasma materials processing; surface cleaning; PMVE; discharge gas; environmentally friendly fine via dry desmear; fine via bottom residue desmearing; fine via of high density package substrate; global warming potential; high density package substrate manufacturing; nonequilibrium atmospheric pressure plasma; perfluoromethyl vinylether; plasma source; reactive gas; ultra high density nonequilibrium plasma; Argon; Discharges (electric); Optical mixing; Optical variables measurement; Plasmas; Stimulated emission; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4673-1966-9
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2012.6248900
  • Filename
    6248900