• DocumentCode
    2722662
  • Title

    Sharp Mixing Time Bounds for Sampling Random Surfaces

  • Author

    Caputo, Pietro ; Martinelli, Fabio ; Toninelli, Fabio Lucio

  • Author_Institution
    Dipt. di Mat., Univ. Roma Tre Rome, Rome, Italy
  • fYear
    2011
  • fDate
    22-25 Oct. 2011
  • Firstpage
    130
  • Lastpage
    139
  • Abstract
    We analyze the mixing time of a natural local Markov Chain (Gibbs sampler) for two commonly studied models of random surfaces: (i) discrete monotone surfaces with "almost planar" boundary conditions and(ii) the one-dimensional discrete Solid-on-Solid (SOS)model. In both cases we prove the first almost optimal bounds. Our proof is inspired by the so-called "meancurvature" heuristic: on a large scale, the dynamics should approximate a deterministic motion in which each point of the surface moves according to a drift proportional to the local inverse mean curvature radius. Key technical ingredients are monotonicity, coupling and an argument due to D. Wilson [17] in the framework of lozenge tiling Markov Chains. The novelty of our approach with respect to previous results consists in proving that, with high probability, the dynamics is dominated by a deterministic evolution which follows the mean curvature prescription. Our method works equally well for both models despite the fact that their equilibrium maximal deviations from the average height profile occur on very different scales.
  • Keywords
    Markov processes; sampling methods; Gibbs sampler; discrete monotone surfaces; equilibrium maximal deviations; natural local Markov chain; one dimensional discrete solid-on-solid model; random surface sampling; sharp mixing time bounds; Boundary conditions; Clocks; Couplings; Lattices; Markov processes; Physics; Solid modeling; Glauber dynamics; Monte Carlo Markov chains (MCMC); lozenge tilings; mean curvature; mixing time; monotone surfaces; spectral gap;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Foundations of Computer Science (FOCS), 2011 IEEE 52nd Annual Symposium on
  • Conference_Location
    Palm Springs, CA
  • ISSN
    0272-5428
  • Print_ISBN
    978-1-4577-1843-4
  • Type

    conf

  • DOI
    10.1109/FOCS.2011.47
  • Filename
    6108158