• DocumentCode
    2722880
  • Title

    Automated quantification and analysis of mandibular asymmetry

  • Author

    Darvann, Tron A. ; Hermann, Nuno V. ; Larsen, Per ; Ólafsdóttir, Hildur ; Hansen, Izabella V. ; Hove, Hanne D. ; Christensen, Leif ; Rueckert, Daniel ; Kreiborg, Sven

  • Author_Institution
    3D Craniofacial Image Res. Lab., Copenhagen Univ. Hosp.(Rigshosp.), Copenhagen, Denmark
  • fYear
    2010
  • fDate
    14-17 April 2010
  • Firstpage
    416
  • Lastpage
    419
  • Abstract
    We present an automated method of spatially detailed 3D asymmetry quantification in mandibles extracted from CT and apply it to a population of infants with unilateral coronal synostosis (UCS). An atlas-based method employing non-rigid registration of surfaces is used for determining deformation fields, thereby establishing detailed anatomical point correspondence between subjects as well as between points on the left and right side of the mid-sagittal plane (MSP). Asymmetry is defined in terms of the vector between a point and the corresponding anatomical point on the opposite side of the MSP after mirroring the mandible across the MSP. A principal components analysis of asymmetry characterizes the major types of asymmetry in the population, and successfully separates the asymmetric UCS mandibles from a number of less asymmetric mandibles from a control population.
  • Keywords
    computerised tomography; image registration; medical image processing; principal component analysis; CT; anatomical point; atlas-based method; control population; deformation fields; infants; mandibular asymmetry analysis; mandibular asymmetry automated quantification; mid-sagittal plane; principal components analysis; surface nonrigid registration; unilateral coronal synostosis; Pediatrics; Principal component analysis; Asymmetry; atlas-based methods; craniofacial malformations; non-rigid registration; unilateral coronal synostosis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2010 IEEE International Symposium on
  • Conference_Location
    Rotterdam
  • ISSN
    1945-7928
  • Print_ISBN
    978-1-4244-4125-9
  • Electronic_ISBN
    1945-7928
  • Type

    conf

  • DOI
    10.1109/ISBI.2010.5490320
  • Filename
    5490320