• DocumentCode
    2723557
  • Title

    Ultralow impedance analysis and evaluation of power distribution network for decoupling capacitor embedded interposers of 3-D integrated LSI system

  • Author

    Kikuchi, Katsuya ; Ueda, Chihiro ; Gomyo, Toshio ; Ookubo, Toshikazu ; Aoyagi, Masahiro ; Sudo, Toshio ; Otsuka, Kanji

  • Author_Institution
    NeRI, Nat. Inst. of Adv. Ind. Sci. & Technol. (AIST), Tsukuba, Japan
  • fYear
    2012
  • fDate
    May 29 2012-June 1 2012
  • Firstpage
    1033
  • Lastpage
    1039
  • Abstract
    We evaluated low-impedance power distribution network (PDN) of decoupling capacitor embedded interposers for 3-D integrated LSI system. Measurements are carried out using the developed impedance analyzer system of a wide frequency range for evaluating ultralow impedance, and calculations are carried out using 2.5-D and 3-D finite element method (FEM) electromagnetic field simulator. We fabricated various types of capacitor mounted or capacitor embedded interposers test element group (TEG), such as surface-mounted and embedded chip capacitors, and thin film capacitors on silicon interposers using the same simple design to compare measurement results with calculation ones. As a result, the ultralow impedance evaluation system that has a high measurement dynamic range at the entire measurable frequency band can be realized. Furthermore, by using 2.5-D and 3-D FEM electromagnetic field simulator, it is expected that the accurate and wideband comparative verification of the PDN impedance analysis and evaluation can be realized.
  • Keywords
    embedded systems; finite element analysis; integrated circuit interconnections; large scale integration; surface mount technology; three-dimensional integrated circuits; 2.5D finite element method; 3D finite element method electromagnetic field simulator; 3D integrated LSI system; TEG; decoupling capacitor embedded interposers; embedded chip capacitors; impedance analyzer; power distribution network; surface mounting; test element group; thin film capacitors; ultralow impedance analysis; Capacitors; Finite element methods; Frequency measurement; Impedance; Impedance measurement; Semiconductor device measurement; Solid modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4673-1966-9
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2012.6248963
  • Filename
    6248963