• DocumentCode
    2723746
  • Title

    Effect of conductivity uncertainties on EEG source localization using a 2D finite element model

  • Author

    Awada, Kassem A. ; Baumann, Stephen B. ; Jackson, David R.

  • Author_Institution
    Dept. of Neurological Surg., Presbyterian Univ. Hosp., Pittsburgh, PA, USA
  • Volume
    5
  • fYear
    1997
  • fDate
    1997
  • Firstpage
    2124
  • Abstract
    The authors present a sensitivity study of electroencephalography based source localization due to errors in tissue conductivities and to errors in modeling the conductivity variation inside the brain and scalp. The study is conducted using a 2D finite element model obtained from an MRI scan of a head cross-section. The effect of uncertainty in the following tissues are studied: white matter, grey matter, cerebrospinal fluid (CSF), skull, and fat. The distribution of source location errors, assuming a single-dipole source model is examined in detail for different dipole locations over the whole brain region. Results presented in this paper clearly point to the following conclusion. Unless the conductivities of the head tissues and the distribution of these tissues throughout the head are modeled accurately, the goal of achieving localization accuracy to within a few millimeters is unattainable
  • Keywords
    brain models; electrical conductivity; electroencephalography; finite element analysis; 2D finite element model; EEG source localization; MRI scan; cerebrospinal fluid; conductivity uncertainties effect; conductivity variation modeling errors; dipole locations; electrodiagnostics; fat; grey matter; head cross-section; head tissues; sensitivity study; single-dipole source model; skull; tissue conductivities; white matter; Brain modeling; Computer errors; Conductivity; Electroencephalography; Finite element methods; Magnetic resonance imaging; Position measurement; Scalp; Skull; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 1997. Proceedings of the 19th Annual International Conference of the IEEE
  • Conference_Location
    Chicago, IL
  • ISSN
    1094-687X
  • Print_ISBN
    0-7803-4262-3
  • Type

    conf

  • DOI
    10.1109/IEMBS.1997.758772
  • Filename
    758772