• DocumentCode
    2724349
  • Title

    Minimal overhead modification of iterative logic arrays for C-testability

  • Author

    Ku, Tsu-Wei ; Soma, Mani

  • Author_Institution
    Data Gen. Corp., Sunnyvale, CA, USA
  • fYear
    1990
  • fDate
    10-14 Sep 1990
  • Firstpage
    964
  • Lastpage
    969
  • Abstract
    The minimal modification of the basic cell of various iterative logic arrays to make them C-testable is investigated. The overhead is measured in terms of the number of additional columns and rows to be added in the flow table of the basic cell. One-dimensional unidirectional arrays without vertical outputs, one-dimensional bidirectional arrays with vertical outputs, and two-dimensional unidirectional arrays are considered. The overhead of the present approach is shown to be smaller than that of previous approaches. It is demonstrated that two extra columns and two extra rows are enough to make any arbitrary two-dimensional orthogonal unidirectional array C-testable
  • Keywords
    logic arrays; logic testing; C-testability; iterative logic arrays; logic testing; minimal modification; one-dimensional bidirectional arrays; one-dimensional unidirectional arrays; overhead modification; two-dimensional unidirectional arrays; vertical outputs; Arithmetic; Circuit testing; Fluid flow measurement; Hardware; Logic arrays; Logic circuits; Logic testing; Observability; Pulse inverters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1990. Proceedings., International
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-8186-9064-X
  • Type

    conf

  • DOI
    10.1109/TEST.1990.114117
  • Filename
    114117