DocumentCode
2724349
Title
Minimal overhead modification of iterative logic arrays for C-testability
Author
Ku, Tsu-Wei ; Soma, Mani
Author_Institution
Data Gen. Corp., Sunnyvale, CA, USA
fYear
1990
fDate
10-14 Sep 1990
Firstpage
964
Lastpage
969
Abstract
The minimal modification of the basic cell of various iterative logic arrays to make them C-testable is investigated. The overhead is measured in terms of the number of additional columns and rows to be added in the flow table of the basic cell. One-dimensional unidirectional arrays without vertical outputs, one-dimensional bidirectional arrays with vertical outputs, and two-dimensional unidirectional arrays are considered. The overhead of the present approach is shown to be smaller than that of previous approaches. It is demonstrated that two extra columns and two extra rows are enough to make any arbitrary two-dimensional orthogonal unidirectional array C-testable
Keywords
logic arrays; logic testing; C-testability; iterative logic arrays; logic testing; minimal modification; one-dimensional bidirectional arrays; one-dimensional unidirectional arrays; overhead modification; two-dimensional unidirectional arrays; vertical outputs; Arithmetic; Circuit testing; Fluid flow measurement; Hardware; Logic arrays; Logic circuits; Logic testing; Observability; Pulse inverters;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1990. Proceedings., International
Conference_Location
Washington, DC
Print_ISBN
0-8186-9064-X
Type
conf
DOI
10.1109/TEST.1990.114117
Filename
114117
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