• DocumentCode
    2725420
  • Title

    Implementing a high performance digital sub-system using the PXI architecture

  • Author

    Manor, David

  • Author_Institution
    Geotest - Marvin Test Syst., Irvine, CA, USA
  • fYear
    2010
  • fDate
    13-16 Sept. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    High Performance digital subsystems have been developed over the years using a variety of proprietary and industry standard architectures such as GPIB and VXI. With the availability of high performance / high density FPGAs and analog electronics, the implementation of high performance digital functional test subsystems has now become a reality using the PXI architecture. The smaller form factor of PXI, which offers users the ability to down size and deploy very cost effective, performance digital subsystems, has also presented some unique challenges for instrument design teams developing these high performance digital subsystems. This paper discusses some major considerations and challenges when implementing high performance digital instrumentation based on the PXI architecture.
  • Keywords
    automatic testing; computerised instrumentation; digital instrumentation; peripheral interfaces; GPIB; PXI architecture; VXI; analog electronics; high density FPGA; high performance FPGA; high performance digital functional test subsystem; high performance digital instrumentation; instrument design; Computer architecture; Connectors; Consumer electronics; Instruments; Power dissipation; Power supplies; Rails; PXI digital subystem; depot test; digital test; intermediate level test;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2010 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-7960-3
  • Type

    conf

  • DOI
    10.1109/AUTEST.2010.5613579
  • Filename
    5613579