DocumentCode
2725420
Title
Implementing a high performance digital sub-system using the PXI architecture
Author
Manor, David
Author_Institution
Geotest - Marvin Test Syst., Irvine, CA, USA
fYear
2010
fDate
13-16 Sept. 2010
Firstpage
1
Lastpage
4
Abstract
High Performance digital subsystems have been developed over the years using a variety of proprietary and industry standard architectures such as GPIB and VXI. With the availability of high performance / high density FPGAs and analog electronics, the implementation of high performance digital functional test subsystems has now become a reality using the PXI architecture. The smaller form factor of PXI, which offers users the ability to down size and deploy very cost effective, performance digital subsystems, has also presented some unique challenges for instrument design teams developing these high performance digital subsystems. This paper discusses some major considerations and challenges when implementing high performance digital instrumentation based on the PXI architecture.
Keywords
automatic testing; computerised instrumentation; digital instrumentation; peripheral interfaces; GPIB; PXI architecture; VXI; analog electronics; high density FPGA; high performance FPGA; high performance digital functional test subsystem; high performance digital instrumentation; instrument design; Computer architecture; Connectors; Consumer electronics; Instruments; Power dissipation; Power supplies; Rails; PXI digital subystem; depot test; digital test; intermediate level test;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON, 2010 IEEE
Conference_Location
Orlando, FL
ISSN
1088-7725
Print_ISBN
978-1-4244-7960-3
Type
conf
DOI
10.1109/AUTEST.2010.5613579
Filename
5613579
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