• DocumentCode
    2725791
  • Title

    Multiple voltage-supplies in TSV-based three-dimensional (3D) power distribution networks

  • Author

    Xu, Zheng ; Gu, Xiaoxiong ; Scheuermann, Michael ; Rose, Kenneth ; Webb, Buckwell C. ; Knickerbocker, John U. ; Lu, Jian-Qiang

  • Author_Institution
    Dept. of Electr., Comput. & Syst. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
  • fYear
    2012
  • fDate
    May 29 2012-June 1 2012
  • Firstpage
    1819
  • Lastpage
    1825
  • Abstract
    It is important to understand how to deliver power into 3D heterogeneous systems, which require different power supplies for different components (e.g., digital, analog, mixed-signal, MEMS parts). This paper reports on a study for a simplified case, where the two power supplies with different voltage levels are uniformly distributed through a TSV-based 3D system. In addition to intrinsic voltage losses along the interconnections, we investigated for the first time the power noises due to electrical couplings between the multiple power supplies. We evaluated the through-silicon-via (TSV)-based 3D power delivery networks by combining the electromagnetic (EM) and SPICE simulations. With this hybrid approach, we first partitioned the 3D system into a number of elements, extracted the RLGC parasitics for each decomposed physical element, and imported them into an assembled system-level equivalent circuit to characterize the 3D power distribution networks.
  • Keywords
    SPICE; circuit simulation; distribution networks; equivalent circuits; integrated circuit interconnections; power supplies to apparatus; three-dimensional integrated circuits; 3D heterogeneous systems; 3D power delivery networks; 3D power distribution networks; SPICE; TSV; different components; electromagnetic simulations; interconnections; multiple voltage-supplies; power supplies; system-level equivalent circuit; three-dimensional power distribution networks; through-silicon-via technology; Capacitors; Integrated circuit modeling; Power grids; Resistance; Solid modeling; System-on-a-chip; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4673-1966-9
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2012.6249085
  • Filename
    6249085