DocumentCode
2725791
Title
Multiple voltage-supplies in TSV-based three-dimensional (3D) power distribution networks
Author
Xu, Zheng ; Gu, Xiaoxiong ; Scheuermann, Michael ; Rose, Kenneth ; Webb, Buckwell C. ; Knickerbocker, John U. ; Lu, Jian-Qiang
Author_Institution
Dept. of Electr., Comput. & Syst. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
fYear
2012
fDate
May 29 2012-June 1 2012
Firstpage
1819
Lastpage
1825
Abstract
It is important to understand how to deliver power into 3D heterogeneous systems, which require different power supplies for different components (e.g., digital, analog, mixed-signal, MEMS parts). This paper reports on a study for a simplified case, where the two power supplies with different voltage levels are uniformly distributed through a TSV-based 3D system. In addition to intrinsic voltage losses along the interconnections, we investigated for the first time the power noises due to electrical couplings between the multiple power supplies. We evaluated the through-silicon-via (TSV)-based 3D power delivery networks by combining the electromagnetic (EM) and SPICE simulations. With this hybrid approach, we first partitioned the 3D system into a number of elements, extracted the RLGC parasitics for each decomposed physical element, and imported them into an assembled system-level equivalent circuit to characterize the 3D power distribution networks.
Keywords
SPICE; circuit simulation; distribution networks; equivalent circuits; integrated circuit interconnections; power supplies to apparatus; three-dimensional integrated circuits; 3D heterogeneous systems; 3D power delivery networks; 3D power distribution networks; SPICE; TSV; different components; electromagnetic simulations; interconnections; multiple voltage-supplies; power supplies; system-level equivalent circuit; three-dimensional power distribution networks; through-silicon-via technology; Capacitors; Integrated circuit modeling; Power grids; Resistance; Solid modeling; System-on-a-chip; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
Conference_Location
San Diego, CA
ISSN
0569-5503
Print_ISBN
978-1-4673-1966-9
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2012.6249085
Filename
6249085
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