DocumentCode
2726139
Title
Modeling of substrate effects inducing non-ideal collector current at low bias
Author
Vida, Daniel ; Van der Toorn, Ramses
Author_Institution
Fac. of Electr. Eng., Math. & Comput. Sci. (EEMCS), Delft Univ. of Technol. (TU Delft), Delft, Netherlands
fYear
2010
fDate
16-19 May 2010
Firstpage
83
Lastpage
86
Abstract
Bipolar junction transistors with a non isolated substrate have extra effects that need to be included in compact models. These effects are due to the existence of a parasitic pnp transistor inside the main transistor having the substrate as its collector. The parasitic can be modeled as a complete transistor, however that would add too much complexity to the whole model. This work focuses on one aspect of the parasitic pnp: the reverse biasing of the collector-substrate junction. This reverse biasing induces currents that are very low (≈ pA) at lower temperatures yet are significant (≈ μA) when the device is heated up to 150°C. With recent interest in new technologies requiring accurate functioning at higher temperatures, the reverse current of the collector substrate junction ceases to be negligible and has to be taken into account. This work studies that effect, and models it in a sufficient way.
Keywords
bipolar transistors; substrates; bipolar junction transistors; collector-substrate junction; nonideal collector current; nonisolated substrate; parasitic pnp transistor; reverse biasing; substrate effects; BiCMOS integrated circuits; Current density; Germanium silicon alloys; Heterojunction bipolar transistors; Integrated circuit noise; Noise generators; Silicon germanium; Solid modeling; Temperature; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics Proceedings (MIEL), 2010 27th International Conference on
Conference_Location
Nis
Print_ISBN
978-1-4244-7200-0
Type
conf
DOI
10.1109/MIEL.2010.5490527
Filename
5490527
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