• DocumentCode
    2728466
  • Title

    FPGA Architecture for RF Transceiver System and Mixed-Signal Low Cost Tests

  • Author

    Koren, Ivo ; Demmerle, Frank ; May, Roland ; Kaibel, Martin ; Sattler, Sebastian

  • Author_Institution
    Infineon Technol. AG, Munich
  • fYear
    2007
  • fDate
    20-24 May 2007
  • Firstpage
    43
  • Lastpage
    48
  • Abstract
    Standard automated test equipment (ATE) for radio frequency (RF) transceiver production testing of today is limited by digital signal processing and data transfer. These constraints can be considerably relaxed by the application of new technology based on field programmable gate array (FPGA). The methods proposed are capable of handling all tasks flexibly and at-speed. FPGA hardware resources are embedded into available ATE environment and support modular signal processing as well as highspeed interfacing. Avoiding any ATE upgrades, the costs for RF transceiver production testing can be driven to an absolute minimum that is achievable.
  • Keywords
    field programmable gate arrays; signal processing; transceivers; FPGA; automated test equipment; field programmable gate array; high-speed interfacing; modular signal processing; radio frequency transceiver; Automatic testing; Costs; Digital signal processing; Field programmable gate arrays; Hardware; Production; Radio frequency; System testing; Test equipment; Transceivers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2007. ETS '07. 12th IEEE European
  • Conference_Location
    Freiburg
  • Print_ISBN
    0-7695-2827-9
  • Type

    conf

  • DOI
    10.1109/ETS.2007.26
  • Filename
    4221572