DocumentCode
2728466
Title
FPGA Architecture for RF Transceiver System and Mixed-Signal Low Cost Tests
Author
Koren, Ivo ; Demmerle, Frank ; May, Roland ; Kaibel, Martin ; Sattler, Sebastian
Author_Institution
Infineon Technol. AG, Munich
fYear
2007
fDate
20-24 May 2007
Firstpage
43
Lastpage
48
Abstract
Standard automated test equipment (ATE) for radio frequency (RF) transceiver production testing of today is limited by digital signal processing and data transfer. These constraints can be considerably relaxed by the application of new technology based on field programmable gate array (FPGA). The methods proposed are capable of handling all tasks flexibly and at-speed. FPGA hardware resources are embedded into available ATE environment and support modular signal processing as well as highspeed interfacing. Avoiding any ATE upgrades, the costs for RF transceiver production testing can be driven to an absolute minimum that is achievable.
Keywords
field programmable gate arrays; signal processing; transceivers; FPGA; automated test equipment; field programmable gate array; high-speed interfacing; modular signal processing; radio frequency transceiver; Automatic testing; Costs; Digital signal processing; Field programmable gate arrays; Hardware; Production; Radio frequency; System testing; Test equipment; Transceivers;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2007. ETS '07. 12th IEEE European
Conference_Location
Freiburg
Print_ISBN
0-7695-2827-9
Type
conf
DOI
10.1109/ETS.2007.26
Filename
4221572
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