DocumentCode
2728480
Title
Redefining the Role of Functional Testing
Author
Thibeault, C. ; Tremblay, D. ; Hariri, Y.
Author_Institution
Dept. of Electr. Eng., Ecole de Technologie Superieure, Montreal, Que.
fYear
2006
fDate
18-21 June 2006
Firstpage
133
Lastpage
136
Abstract
In this paper, we propose a new role for functional testing. We show that it can be used to optimize test sets in terms of test time and automated test equipment (ATE) memory resources, or to increase coverage. We also propose to ease the generation of functional test patterns, by reusing data sequences initially generated with system-level tools for validation purposes
Keywords
automatic test equipment; automatic test pattern generation; automated test equipment; data sequences reduction; functional test patterns; functional testing; system-level tools; Automatic testing; CMOS technology; Circuit testing; Cost function; Fault detection; Logic testing; Quality management; System testing; Test equipment; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2006 IEEE North-East Workshop on
Conference_Location
Gatineau, Que.
Print_ISBN
1-4244-0416-9
Electronic_ISBN
1-4244-0417-7
Type
conf
DOI
10.1109/NEWCAS.2006.250947
Filename
4016978
Link To Document