DocumentCode
2733471
Title
Characterization of solar cell degradation due to electrostatic discharge on multi-junction solar cell
Author
Okumura, Teppei ; Imaizumi, Mitsuru ; Toyoda, Kazuhiro ; Cho, Mengu
Author_Institution
Japan Aerosp. Exploration Agency, Tsukuba, Japan
fYear
2010
fDate
20-25 June 2010
Abstract
A shunt resistance on the solar cell edge which is made by an electrostatic discharge (discharge) causes the degradation of multi-junction solar cell (MJ cell). To prevent the degradation, a trench was formed along the edge of multi-junction solar cell (AD MJ cell). The degradation characterization tests were performed on state-of art MJ cell and AD MJ cell to investigate the effect of trench in plasma environment.
Keywords
electrostatic discharge; solar cells; electrostatic discharge; multijunction solar cell; plasma environment; shunt resistance; solar cell degradation; solar cell edge; trench effect; Discharges;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
Conference_Location
Honolulu, HI
ISSN
0160-8371
Print_ISBN
978-1-4244-5890-5
Type
conf
DOI
10.1109/PVSC.2010.5614144
Filename
5614144
Link To Document