• DocumentCode
    2733611
  • Title

    Practical challenges of achieving high efficiency boron back surface field solar cells

  • Author

    Das, A. ; Ramanathan, S. ; Upadhyaya, A. ; Meemongkolkiat, V. ; Rohatgi, A.

  • Author_Institution
    Univ. Center of Excellence for Photovoltaic Res. & Educ., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2010
  • fDate
    20-25 June 2010
  • Abstract
    This work examines two challenges facing the commercialization of boron diffused crystalline silicon solar cells - unintentional iron contamination and the passivation of a textured boron diffused surface. We find that when Fe is introduced into silicon wafers by boron diffusion, the Fe often remains trapped in the boron surface layer and undetectable using bulk lifetime measurements. However this trapped Fe is still a threat to bulk lifetime since subsequent thermal processes can inject this Fe into the bulk. Importantly, POCl3 appears to be ineffective at gettering the trapped Fe; POCl3 gettering works only when the trapped Fe is injected into the bulk prior to POCl3 deposition. An alternate strategy is to directly getter the trapped Fe by using a negatively charged dielectric that is placed on the boron diffused surface. Random pyramid texturing was found to be detrimental to the spin-on SiO2 induced passivation of a boron doped surface. This passivation loss can be minimized by removing the texture with a KOH etch and ~650 mV VOC could be achieved on both FZ and Cz material.
  • Keywords
    boron; chemical vapour deposition; grain boundary diffusion; passivation; silicon; solar cells; POCl3; SiO2:B; boron back surface field solar cells; boron diffusion; crystalline silicon solar cells; deposition; dielectric; iron contamination; passivation; silicon wafers; surface texturing; Boron; Dielectrics; Iron; Passivation; Silicon; Surface texture;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-5890-5
  • Type

    conf

  • DOI
    10.1109/PVSC.2010.5614151
  • Filename
    5614151