• DocumentCode
    2734545
  • Title

    Electric-field Vector Measurement with Fiber-mounted Electro-optic Probe

  • Author

    Togo, Hiroyoshi ; Mochizuki, Shoji ; Kukutsu, Naoya ; Nagatsuma, Tadao

  • Author_Institution
    Microsyst. Integration Labs., NTT, Atsugi
  • fYear
    2009
  • fDate
    12-16 Jan. 2009
  • Firstpage
    461
  • Lastpage
    464
  • Abstract
    We have developed an electric-field vector measurement system that operates by scanning with a sensitivity-stabilized fiber-mounted electro-optic (EO) probe. This system can map the electric-field distribution in an area ten times larger than that with a conventional EO probe. Since the properties (e.g. sensitivity and directivity) of a longitudinal and transverse-detection probe are the same, a combination of the electric fields measured with each probe provides the electric-field vector. The intensity and phase distribution of the electric fields measured on each orthogonal axis represent an asymmetric shape of a planer circuit with a Vivaldi antenna, which cannot be calculated by the simulation with an ideal model. The vector spatial field calculated from the measured electric field shows the electric-field dynamics above and around the planar circuit. Consequently, the visualization of the vector spatial field based on measurements obtained with the fiber-mounted EO probe provides intuitive analyses and diagnoses of circuit and antenna performance.
  • Keywords
    electric field measurement; electro-optical devices; fibre optic sensors; probes; Vivaldi antenna; electric field dynamics; electric-field vector measurement system; fiber-mounted electro-optic probe; longitudinal detection probe; planar circuit; transverse detection probe; Antenna measurements; Circuit simulation; Electric variables measurement; Metalworking machines; Performance analysis; Phase measurement; Probes; Shape measurement; Visualization; Vivaldi antennas;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2009 20th International Zurich Symposium on
  • Conference_Location
    Zurich
  • Print_ISBN
    978-3-9523286-4-4
  • Type

    conf

  • DOI
    10.1109/EMCZUR.2009.4783490
  • Filename
    4783490