• DocumentCode
    2734595
  • Title

    Measuring degradation rates without irradiance data

  • Author

    Pulver, Steve ; Cormode, Daniel ; Cronin, Alex ; Jordan, Dirk ; Kurtz, Sarah ; Smith, Ryan

  • Author_Institution
    Univ. of Arizona, Tucson, AZ, USA
  • fYear
    2010
  • fDate
    20-25 June 2010
  • Abstract
    A method to report photovoltaic (PV) system degradation rates without using irradiance data is demonstrated. First, a set of relative degradation rates are determined by comparing daily AC final yields from a group of PV systems relative to the average final yield of all the PV systems. Then, the difference between relative and absolute degradation rates is found using a Bayesian statistical analysis. This approach is verified by comparing to methods that utilize irradiance data. This approach is significant because PV systems are often deployed without irradiance sensors, so the analysis method described here may enable measurements of degradation using data that were previously thought to be unsuitable for degradation studies.
  • Keywords
    Bayes methods; photovoltaic power systems; statistical analysis; Bayesian statistical analysis; PV systems; daily AC final yields; irradiance data; photovoltaic system degradation rates; relative degradation rates; Area measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-5890-5
  • Type

    conf

  • DOI
    10.1109/PVSC.2010.5614208
  • Filename
    5614208