DocumentCode
27368
Title
Effects of low temperature and nanoparticles on electrical trees in RTV silicone rubber
Author
Du, B. ; Su, J.G. ; Han, Trung
Author_Institution
Key Laboratory of Smart Grid of Education Ministry School of Electrical Engineering and Automation Tianjin University, Tianjin 300072, China
Volume
21
Issue
4
fYear
2014
fDate
Aug-14
Firstpage
1892
Lastpage
1988
Abstract
The operating temperature of power cable system has a great influence on the electrical performance of room temperature vulcanizing (RTV) silicone rubber. This paper investigated the effects of low temperature and nanoparticles on electrical tree in RTV silicone rubber. Samples were prepared by mixing SiO2 nanoparticles into RTV silicone rubber, with the content of 0, 0.5, 1, 1.5 and 2 wt% respectively. The experiment temperature was ranged from - 30 to -90 °C. AC voltage with a frequency of 50 Hz was applied between a needle-plate electrode. The electrical tree patterns, growth rate, expansion coefficient, fractal dimension and proportion of accumulated damage were studied. The results reveal that both nanoparticles and low temperature environment have a significant impact on the electrical tree growth. The tree patterns are branch tree or bush tree when the temperature is higher than -60 °C; however, there is only pine tree when the temperature is lower than -90 °C. Compared with - 30 °C, some tree channels are easier to propagate at - 60 °C in silicone rubber. It is also suggested that the temperature affects the expansion coefficient of electrical tree. The fractal dimension of the electrical tree increases with the nanoparticle content, while the accumulated damage of treeing area shows the opposite tendency.
Keywords
Crystallization; Fractals; Nanoparticles; Polymers; Rubber; Temperature; Silicone rubber; electrical tree; expansion coefficient; fractal dimension.; low temperature; nanoparticles;
fLanguage
English
Journal_Title
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher
ieee
ISSN
1070-9878
Type
jour
DOI
10.1109/TDEI.2014.004341
Filename
6878032
Link To Document