• DocumentCode
    2738491
  • Title

    Electron Transport Across Interfaces in Horizontal Carbon Nanofiber Interconnects

  • Author

    Yamada, T. ; Suzuki, M. ; Kitsuki, H. ; Saito, T. ; Fabris, D. ; Sun, X. ; Wilhite, P. ; Yang, C.Y.

  • Author_Institution
    Center for Nanostruct., Santa Clara Univ., Santa Clara, CA
  • fYear
    2008
  • fDate
    18-21 Aug. 2008
  • Firstpage
    263
  • Lastpage
    266
  • Abstract
    In a carbon nanofiber (CNF) metal contact such as a bridge between two metallic electrodes, passing high current (current stressing) reduces the total resistance of the system (CNF resistance RCNF and contact resistance Rc) by orders of magnitude. The role of current stressing is modeled as a reduction in the interfacial tunneling gap with transport characteristics attributed to tunneling between Au and CNF. The model predicts a reduction in Rc and the nonlinearity in the current-voltage (I-V) characteristics gradually disappears as Rc decreases. These results are consistent with I-V behavior measured experimentally.
  • Keywords
    carbon fibres; contact resistance; gold; integrated circuit interconnections; nanostructured materials; semiconductor-metal boundaries; tunnelling; Au-C; carbon nanofiber-metal contact; contact resistance; current stressing; current-voltage characteristics; electron transport; horizontal carbon nanofiber interconnects; interfacial tunneling gap; metallic electrodes; Bridge circuits; Contact resistance; Current measurement; Electric breakdown; Electrical resistance measurement; Electrodes; Electrons; Gold; Tunneling; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
  • Conference_Location
    Arlington, Texas
  • Print_ISBN
    978-1-4244-2103-9
  • Electronic_ISBN
    978-1-4244-2104-6
  • Type

    conf

  • DOI
    10.1109/NANO.2008.84
  • Filename
    4617066