• DocumentCode
    2738639
  • Title

    Development of radiation hard Ga0.50In0.50P/Ga0.99In0.01As/Ge space solar cells with multi quantum wells

  • Author

    Kellenbenz, René ; Hoheisel, Raymond ; Kailuweit, Peter ; Guter, Wolfgang ; Dimroth, Frank ; Bett, Andreas W.

  • Author_Institution
    Fraunhofer ISE, Freiburg, Germany
  • fYear
    2010
  • fDate
    20-25 June 2010
  • Abstract
    The efficiency of today´s Ga0.5In0.5P/Ga0.99In0.01As/Ge triple-junction space solar cells can be improved by the incorporation of multi-quantum wells to extend the absorption of the GaInAs middle cell. In this paper, the effect of high energy electron irradiation on the device performance of quantum well single- and triple-junction devices was investigated. For GaAs single-junction solar cells it could be shown that the degradation is predominantly in voltage and not in current as for conventional p-n solar cells. This result was also confirmed for triple-junction quantum well solar cells. An excellent remaining factor in short-circuit current density of over 97% was measured after irradiation with 1 MeV electrons at a fluence of 1015 cm-2. Also the remaining factor for Voc was high with 91%. However, the fillfactor of this cell degraded 20% leading to a low overall end of life (EOL) efficiency. This may be due to a low shunt resistance of the device.
  • Keywords
    III-V semiconductors; electrons; gallium arsenide; gallium compounds; indium compounds; semiconductor quantum wells; short-circuit currents; solar cells; Ga0.50In0.50P-Ga0.99In0.01As-Ge; electron volt energy 1 MeV; electrons; high energy electron irradiation; multi quantum wells; p-n solar cells; quantum well single-junction devices; quantum well triple-junction devices; radiation hard space solar cells; short-circuit current density; single-junction solar cells; Absorption; Gallium arsenide; Junctions; Photonic band gap; Photovoltaic cells; Radiation effects;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-5890-5
  • Type

    conf

  • DOI
    10.1109/PVSC.2010.5614525
  • Filename
    5614525