• DocumentCode
    2738661
  • Title

    Equivalent Single Conductor Modeling of Carbon Nanotube Bundles for Transient Analysis of High-Speed Interconnects

  • Author

    Amore, M.D. ; Ricci, M. ; Tamburrano, A.

  • Author_Institution
    Res. Center for Nanotechnol. Appl. to Eng., Univ. of Rome Sapienza, Rome
  • fYear
    2008
  • fDate
    18-21 Aug. 2008
  • Firstpage
    307
  • Lastpage
    310
  • Abstract
    An equivalent single conductor (ESC) model is proposed for the time domain analysis of a CMOS gate driving a high speed interconnect consisting of a single wall carbon nanotube (SWCNT) bundle. The computed responses to a step-input voltage are compared to the ones of a multiconductor transmission line (MTL) model. The results obtained are in very good agreement. The 50% time delay tpd of the nano-interconnect is predicted by means the MTL and ESC model and by applying an analytical formulation. The sensitivity analysis of tpd is carried out with respect to the number of the conductive tubes in the bundle, the length and the terminal equivalent capacitance of the interconnect configuration.
  • Keywords
    CMOS integrated circuits; carbon nanotubes; delays; integrated circuit interconnections; multiconductor transmission lines; nanoelectronics; nanotube devices; C; CMOS gate; conductive tubes; equivalent single conductor model; equivalent single conductor modeling; high speed interconnect; high-speed interconnects; multiconductor transmission line model; single wall carbon nanotube bundle; step-input voltage; terminal equivalent capacitance; time delay; time domain analysis; transient analysis; Carbon nanotubes; Conductors; Delay effects; Multiconductor transmission lines; Predictive models; Semiconductor device modeling; Sensitivity analysis; Time domain analysis; Transient analysis; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
  • Conference_Location
    Arlington, Texas
  • Print_ISBN
    978-1-4244-2103-9
  • Electronic_ISBN
    978-1-4244-2104-6
  • Type

    conf

  • DOI
    10.1109/NANO.2008.98
  • Filename
    4617080