DocumentCode
2738956
Title
Effect of Contacts on Quantum Transport in Nanostructures
Author
Novakovic, B. ; Knezevic, I.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Wisconsin, Madison, WI
fYear
2008
fDate
18-21 Aug. 2008
Firstpage
362
Lastpage
365
Abstract
In quasiballistic nanoscale devices, the process of relaxation towards a steady state cannot be attributed to carrier scattering. Rather, carrier exchange between the active region and the rapidly dephasing contacts is the mechanism governing relaxation. In this paper, we present a novel technique for the treatment of quantum transport in quasiballistic semiconductor nanostructures. The approach utilizes a first-principles model interaction between the current-limiting active region and the contacts. With the use of the model interaction and by accounting for the energy relaxation in the contacts due to the electron- electron interaction, irreversible evolution of the active region´s many body statistical operator is derived in the Markovian approximation. Specifically, analytical steady-state distribution functions are derived for a generic two-terminal nanostructure, and used to obtain the steady-state I-V curves for the cases of a resonant-tunneling diode and an nin diode.
Keywords
Markov processes; ballistic transport; nanocontacts; nanostructured materials; quantum interference devices; quantum point contacts; resonant tunnelling diodes; Markovian approximation; carrier exchange; carrier scattering; electron- electron interaction; energy relaxation; nanostructured semiconductor; nanostructures; nin diode; quantum transport; quasiballistic nanoscale devices; resonant-tunneling diode; steady state; Contacts; Nanoscale devices; Particle scattering; Quantum computing; Resonance; Resonant tunneling devices; Semiconductor diodes; Semiconductor nanostructures; Steady-state; USA Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
Conference_Location
Arlington, TX
Print_ISBN
978-1-4244-2103-9
Electronic_ISBN
978-1-4244-2104-6
Type
conf
DOI
10.1109/NANO.2008.112
Filename
4617094
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