• DocumentCode
    2739419
  • Title

    A Novel Halogen-Free, Phosphorous-free and Heat Resistant Material for Copper clad laminate

  • Author

    Liu, Chia Yu ; Lu, June Che ; Hsu, Su Wen

  • Author_Institution
    Electron. Mater. Div., Tech. Dept. of Epoxy Resin, Nan Ya Plastic Corp.
  • fYear
    2008
  • fDate
    22-24 Oct. 2008
  • Firstpage
    171
  • Lastpage
    173
  • Abstract
    Brominated and phosphorous-containing type epoxy resins are important binders for current flame retardant CCL (copper clad laminate). Nevertheless, they will cause environment problems. Brominated type resins will generate dioxins from inappropriate incineration condition and phosphorous type resins may cause the pollution of aquatic environment. On July 1, 2006, two important directives on environment protection were releasecedy European Union, i.e., RoHS and WEEE. The Sn-Pb solder shouldbe replaced by lead free type solder and the JR Reflow will increase from 200degC to 255degC. Given the above, we developed a new halogen-free and phosphorous-free composition, which is comprising nitrogen-containing resin, inorganic filler and modifier . The nitrogen and inorganic filler impart CCL with flame-retardant properties and render CCL more environment-friendly. The new product is also good in heat properties and can meet the specification of IPC41O1B.
  • Keywords
    copper; filled polymers; flame retardants; incineration; laminates; lead alloys; nitrogen; solders; tin alloys; water pollution; Cu; IPC41O1B; SnPb; aquatic environment pollution; brominated epoxy resins; dioxins; environment problems; flame retardant copper clad laminate; heat resistant material; incineration; nitrogen-containing resin; phosphorous-containing type epoxy resins; solder; Copper; Electronic waste; Environmentally friendly manufacturing techniques; Epoxy resins; Flame retardants; Incineration; Laminates; Lead; Pollution; Protection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly & Circuits Technology Conference, 2008. IMPACT 2008. 3rd International
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-3623-1
  • Electronic_ISBN
    978-1-4244-3624-8
  • Type

    conf

  • DOI
    10.1109/IMPACT.2008.4783836
  • Filename
    4783836