• DocumentCode
    2739767
  • Title

    Recent radiation test results at JPL

  • Author

    Pritchard, Bruce E. ; Rax, Bernard G. ; McClure, Steven S.

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • fYear
    2003
  • fDate
    21-25 July 2003
  • Firstpage
    24
  • Lastpage
    33
  • Abstract
    This paper documents recent TID (including ELDRS) and proton damage test results obtained by JPL. Unusual test results, such as abnormally low or high failure levels or unusual failure or response mechanisms, are emphasized.
  • Keywords
    failure analysis; protons; radiation effects; semiconductor device reliability; ELDRS; JPL; Jet Propulsion Laboratory; TID; abnormally low failure level; displacement damage; enhanced low dose rate sensitivity; high failure level; proton damage test; radiation test; response mechanisms; total induced dose; Laboratories; Manufacturing processes; NASA; Performance evaluation; Process design; Propulsion; Protons; Semiconductor device testing; Space technology; Telephony;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2003. IEEE
  • Print_ISBN
    0-7803-8127-0
  • Type

    conf

  • DOI
    10.1109/REDW.2003.1281317
  • Filename
    1281317
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2739767