• DocumentCode
    2739776
  • Title

    Degradation of commercially available DAC ICs in a mixed-radiation environment

  • Author

    Aghara, S. ; Fink, R.J. ; Charlton, W.S. ; Bhuva, B. ; Samadi, M.R. ; Ochoa, J.A. ; Porter, J.R.

  • Author_Institution
    Nucl. Eng. Teaching Lab., Texas Univ., Austin, TX, USA
  • fYear
    2003
  • fDate
    21-25 July 2003
  • Firstpage
    34
  • Lastpage
    37
  • Abstract
    Experiments were performed at several fluence levels in a mixed-radiation environment (fast neurons and gamma rays) to better understand electrical performance of digital to analog converters under irradiation. Procedures, facilities and results are presented.
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; electron device testing; integrated circuit reliability; radiation effects; IC degradation; digital-analog converters; electrical performance; fast neurons; gamma rays; integrated circuits; irradiation; mixed-radiation environment; Circuits; Degradation; Digital signal processing; Digital-analog conversion; Laboratories; Microelectronics; Neutrons; Resistors; Switches; Telephony;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2003. IEEE
  • Print_ISBN
    0-7803-8127-0
  • Type

    conf

  • DOI
    10.1109/REDW.2003.1281318
  • Filename
    1281318
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2739776