• DocumentCode
    2739898
  • Title

    Electronic Characteristics of Bacteriorhodopsin

  • Author

    Walczak, Karl A. ; Cheam, Daw ; Lueking, Don ; Bergstrom, Paul L. ; Friedrich, Craig

  • Author_Institution
    Dept. of Mech. Eng. & Eng. Mech., Michigan Technol. Univ., Houghton, MI
  • fYear
    2008
  • fDate
    18-21 Aug. 2008
  • Firstpage
    553
  • Lastpage
    556
  • Abstract
    To effectively integrate bacteriorhodopsin (bR) with micro electromechanical systems (MEMS) and nano electromechanical systems (NEMS) devices, it is critical to know the electrical properties of the material and to understand how it will affect the functionality of the device. Inductance, capacitance and resistance (LCR) measurements can be used to determine material characteristics, such as permittivity, film thickness, and capacitance. In this paper, LCR measurements of dried films of oriented and unoriented bR with both light-on and light-off conditions are presented. Tests were performed on dried films of bR to determine if there is a relationship between LCR measurements and orientation, light-on/off, frequency, and time. The results indicated that the LCR measurements depended on the thickness and area of the film, but not on the orientation, as with other biological materials such as muscle. However, there was a transient LCR response for both oriented and unoriented bR which depends on light intensity. The possible effect of integrating this material with a single electron transistor (SET) is also briefly discussed.
  • Keywords
    biomolecular electronics; capacitance; electrical resistivity; inductance; permittivity; single electron transistors; LCR measurements; bacteriorhodopsin; capacitance; film thickness; inductance; microelectromechanical systems; nanoelectromechanical systems; permittivity; resistance; single electron transistor; Biological materials; Capacitance; Electric resistance; Electrical resistance measurement; Electromechanical systems; Immune system; Micromechanical devices; Nanoelectromechanical systems; Permittivity measurement; Thickness measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
  • Conference_Location
    Arlington, TX
  • Print_ISBN
    978-1-4244-2103-9
  • Electronic_ISBN
    978-1-4244-2104-6
  • Type

    conf

  • DOI
    10.1109/NANO.2008.164
  • Filename
    4617146