DocumentCode
2740611
Title
Influence of Electroless Copper on IC Reliability
Author
Magaya, Tafadzwa
Author_Institution
Atotech Deutschland GmbH, Berlin
fYear
2008
fDate
22-24 Oct. 2008
Firstpage
414
Lastpage
416
Abstract
The process of plating through holes (PTH) is inherent to modern PCB manufacturing. In an arena of increasing circuit density and layer counts, the reliability of the PTH process is under constant microscopic examination. The aim of electroless copper is to plate a conductive layer through a hole or into a blind microvia. In this context an interconnect (IC) refers to the copper to copper adhesion within the functional constraints of a circuit board. As these can include many inner layers, the inter connection quality is of prime concern. In addition the PTH process also inherits the issues from the preceding manufacture.
Keywords
integrated circuit reliability; integrated circuit testing; printed circuit testing; IC reliability; PCB manufacturing; PTH process; blind microvia; conductive layer; electroless copper; interconnect; plating through holes; Copper; Drilling; Environmentally friendly manufacturing techniques; Lead; Manufacturing processes; Modems; Soldering; Temperature; Thermal stresses; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Microsystems, Packaging, Assembly & Circuits Technology Conference, 2008. IMPACT 2008. 3rd International
Conference_Location
Taipei
Print_ISBN
978-1-4244-3623-1
Electronic_ISBN
978-1-4244-3624-8
Type
conf
DOI
10.1109/IMPACT.2008.4783900
Filename
4783900
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