• DocumentCode
    2740611
  • Title

    Influence of Electroless Copper on IC Reliability

  • Author

    Magaya, Tafadzwa

  • Author_Institution
    Atotech Deutschland GmbH, Berlin
  • fYear
    2008
  • fDate
    22-24 Oct. 2008
  • Firstpage
    414
  • Lastpage
    416
  • Abstract
    The process of plating through holes (PTH) is inherent to modern PCB manufacturing. In an arena of increasing circuit density and layer counts, the reliability of the PTH process is under constant microscopic examination. The aim of electroless copper is to plate a conductive layer through a hole or into a blind microvia. In this context an interconnect (IC) refers to the copper to copper adhesion within the functional constraints of a circuit board. As these can include many inner layers, the inter connection quality is of prime concern. In addition the PTH process also inherits the issues from the preceding manufacture.
  • Keywords
    integrated circuit reliability; integrated circuit testing; printed circuit testing; IC reliability; PCB manufacturing; PTH process; blind microvia; conductive layer; electroless copper; interconnect; plating through holes; Copper; Drilling; Environmentally friendly manufacturing techniques; Lead; Manufacturing processes; Modems; Soldering; Temperature; Thermal stresses; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly & Circuits Technology Conference, 2008. IMPACT 2008. 3rd International
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-3623-1
  • Electronic_ISBN
    978-1-4244-3624-8
  • Type

    conf

  • DOI
    10.1109/IMPACT.2008.4783900
  • Filename
    4783900