DocumentCode
2741735
Title
THz near-field microscopy - A review
Author
Lin, Hungyen ; Fischer, Bemd M. ; Mickan, Samuel P. ; Abbott, Derek
Author_Institution
Univ. of Adelaide, Adelaide
fYear
2006
fDate
18-22 Sept. 2006
Firstpage
441
Lastpage
441
Abstract
One of the major limitations of THz imaging is low spatial resolution. Consequently, various techniques have been proposed in the literature to break the diffraction limit. Many of the existing techniques draw inspiration from near-field scanning optical microscopy, while other techniques tightly focus optical beams to reduce the size of the generated THz beams. This paper reviews briefly the existing THz near-field methods and recent developments for identifying possible areas of research potential.
Keywords
image resolution; near-field scanning optical microscopy; reviews; submillimetre wave imaging; THz imaging; THz near-field microscopy; near-field scanning optical microscopy; review; spatial resolution; Apertures; Focusing; Image resolution; Microscopy; Optical beams; Optical imaging; Optical pumping; Physics; Probes; Spatial resolution;
fLanguage
English
Publisher
ieee
Conference_Titel
Infrared Millimeter Waves and 14th International Conference on Teraherz Electronics, 2006. IRMMW-THz 2006. Joint 31st International Conference on
Conference_Location
Shanghai
Print_ISBN
1-4244-0400-2
Electronic_ISBN
1-4244-0400-2
Type
conf
DOI
10.1109/ICIMW.2006.368649
Filename
4222383
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