DocumentCode
2742741
Title
Limitations, Innovations, And Challenges Of Circuits & Devices Into Half-Micron And Beyond
Author
Nagata, M.
Author_Institution
Hitachi Ltd.
fYear
1991
fDate
May 30 1991-June 1 1991
Firstpage
39
Lastpage
42
Keywords
Breakdown voltage; Power dissipation; Semiconductor materials; Signal processing; Switching circuits; Technological innovation; Temperature; Thermal resistance; Very large scale integration; Virtual manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Circuits, 1991. Digest of Technical Papers. 1991 Symposium on
Conference_Location
Oiso, Japan
Type
conf
DOI
10.1109/VLSIC.1991.760069
Filename
760069
Link To Document