• DocumentCode
    2742843
  • Title

    Computation reduction for statistical analysis of the effect of nano-CMOS variability on asynchronous circuits

  • Author

    Xie, Zheng ; Edwards, Doug

  • Author_Institution
    Sch. of Comput. Sci., Univ. of Manchester, Manchester, UK
  • fYear
    2010
  • fDate
    14-16 April 2010
  • Firstpage
    161
  • Lastpage
    166
  • Abstract
    The intrinsic atomistic variability of nano-scale integrated circuit (IC) technology must be taken into account when analyzing circuit designs to predict likely yield. Monte Carlo (MC) based statistical techniques aim to do this by analysing many randomized copies of the circuit. A major problem is the computational cost of carrying out sufficient analyses to produce statistically reliable results. The MC analyses required for asynchronous circuits are more difficult than are generally required for clocked circuits because of the more complex timing patterns created by handshaking mechanisms. It is important to reduce the computational complexity of MC analysis required for asynchronous circuits. The use of `Statistical Behavioural Circuit Blocks (SBCB)´ is investigated as a means of reducing the dimensionality of the analysis, and this is combined with an implementation of `Statistical Blockade´ to achieve significant reduction in the computational costs. The reduction in computation time achieved by the more efficient MC analysis is illustrated by statistically analysing several simple handshaking circuits.
  • Keywords
    CMOS digital integrated circuits; Monte Carlo methods; asynchronous circuits; computational complexity; Monte Carlo based statistical techniques; asynchronous circuits; computational complexity; handshaking mechanisms; nanoCMOS variability; nanoscale integrated circuit technology; statistical behavioural circuit blocks; statistical blockade; Asynchronous circuits; Circuit analysis; Circuit analysis computing; Circuit synthesis; Computational efficiency; Integrated circuit reliability; Integrated circuit technology; Integrated circuit yield; Monte Carlo methods; Statistical analysis; Monte Carlo (MC) statistical techniques; Statistical Behavioural Circuit Block; Statistical Blockade; asynchronous circuit; nano-scale integrated circuit; variability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Diagnostics of Electronic Circuits and Systems (DDECS), 2010 IEEE 13th International Symposium on
  • Conference_Location
    Vienna
  • Print_ISBN
    978-1-4244-6612-2
  • Type

    conf

  • DOI
    10.1109/DDECS.2010.5491795
  • Filename
    5491795