DocumentCode
2742893
Title
Current Sensing Completion Detection in deep sub-micron technologies
Author
Nagy, Lukas ; Stopjakova, Viera
Author_Institution
Dept. of Microelectron., Slovak Univ. of Technol., Bratislava, Slovakia
fYear
2010
fDate
14-16 April 2010
Firstpage
145
Lastpage
148
Abstract
Current Sensing Completion Detection (CSCD) method in asynchronous circuits is addressed. Current Sensing represents a simple but effective and reliable approach to detect completion of computation in asynchronous (self-timed) systems. However, in recent deep sub-micron technologies, several challenges, such as significant influence of process variations, leakage current power dissipation with circuit in off-state, etc., have to be faced. This paper presents an overview of these undesired effects and proposes some prospective solutions.
Keywords
asynchronous circuits; leakage currents; asynchronous circuit system; current sensing completion detection method; deep submicron technologies; leakage current power dissipation; Asynchronous circuits; CMOS technology; Clocks; Delay; Digital circuits; Energy consumption; Leakage current; Power dissipation; Silicon; Voltage; asynchronous system; completion detection; current sensing; sub-micron technologies;
fLanguage
English
Publisher
ieee
Conference_Titel
Design and Diagnostics of Electronic Circuits and Systems (DDECS), 2010 IEEE 13th International Symposium on
Conference_Location
Vienna
Print_ISBN
978-1-4244-6612-2
Type
conf
DOI
10.1109/DDECS.2010.5491799
Filename
5491799
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