• DocumentCode
    2746994
  • Title

    Patent analysis for technology forecasting: Sector-specific applications

  • Author

    Yoon, Byungun ; Lee, Sungjoo

  • Author_Institution
    Dongguk Univ., Seoul
  • fYear
    2008
  • fDate
    28-30 June 2008
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Although patent analysis is a powerful technique to forecast the future of technology, it is not obvious whether the analysis is applicable to technology forecasting over all industries. Since the strategies of firms to protect their innovation vary among patents and trade secrets according to the characteristics of industries, patent analysis might be inappropriate to some industries. Therefore, this paper aims at improving the usefulness of patent analysis in TF by identifying relevant industries which the patent-based TF can be used in. To this end, first, sectoral differences in patenting activities will be investigated, presenting implications from patent activities, innovation patterns and patent statistics. Second, the applicability of patent trend analysis for technology forecasting will be explored in each industry by applying S-curve fitting with patent data. Finally, the method to improve the performance of patent-based TF will be suggested. The comparison of patent application status will make technology forecasting accurate, considering a time lag between R&D investment and patent application of the technology. This process will provide a good vehicle for precise TF by clarifying the application of patent analysis.
  • Keywords
    innovation management; investment; patents; statistical analysis; technological forecasting; R&D investment; innovation; patent analysis; patent statistics; technology forecasting; Fitting; Intellectual property; Investments; Paper technology; Pattern analysis; Protection; Research and development; Statistics; Technological innovation; Technology forecasting; Patent analysis; S-curve; Sectoral patterns of innovation; Technology forecasting;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering Management Conference, 2008. IEMC Europe 2008. IEEE International
  • Conference_Location
    Estoril
  • Print_ISBN
    978-1-4244-2288-3
  • Electronic_ISBN
    978-1-4244-2289-0
  • Type

    conf

  • DOI
    10.1109/IEMCE.2008.4617997
  • Filename
    4617997