• DocumentCode
    2747042
  • Title

    Monitoring of interface crack between solder ball and copper plate subjected to cyclic tensile loading under fluctuating temperature by direct current potential difference method

  • Author

    Tada, Naoya ; Ezaki, Yusuke

  • Author_Institution
    Grad. Sch. of Natural Sci. & Technol., Okayama Univ., Okayama
  • fYear
    2008
  • fDate
    22-24 Oct. 2008
  • Firstpage
    232
  • Lastpage
    235
  • Abstract
    In this study, cyclic tension tests were carried out under fluctuating temperature condition in order to evaluate the strength of lead-free solder/copper interface. Interface crack was continuously monitored by the direct current potential difference method and the crack area ratio was successfully evaluated by the proposed method. The method could be useful not only for the in situ monitoring of cracks in interface strength tests under fluctuating temperature but also for online and on-chip monitoring of individual interface in the electric packages and various electric connections by designing similar embedded circuits.
  • Keywords
    condition monitoring; copper; cracks; plates (structures); solders; tensile testing; copper plate; cyclic tensile loading; cyclic tension tests; direct current potential difference method; electric connections; electric packages; embedded circuits; fluctuating temperature; interface crack; solder ball; Copper; Environmentally friendly manufacturing techniques; Heating; Lead; Monitoring; Power supplies; Resists; Soldering; Temperature; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Materials and Packaging, 2008. EMAP 2008. International Conference on
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-3620-0
  • Electronic_ISBN
    978-1-4244-3621-7
  • Type

    conf

  • DOI
    10.1109/EMAP.2008.4784271
  • Filename
    4784271