• DocumentCode
    2747292
  • Title

    Flat frequency response in the electronic measurement of the Boltzmann constant

  • Author

    Qu, Jifeng ; Benz, Samuel P. ; Fu, Yunfeng ; Zhang, Jianqiang ; Rogalla, Horst ; Pollarolo, Alessio

  • Author_Institution
    Nat. Inst. of Metrol., Beijing, China
  • fYear
    2012
  • fDate
    1-6 July 2012
  • Firstpage
    216
  • Lastpage
    217
  • Abstract
    A new quantum voltage calibrated Johnson noise thermometer (JNT) was developed at NIM to demonstrate the electrical approach that determines the Boltzmann constant k by comparing electrical and thermal noise power. A measurement with an integration period of 10 hours and bandwidth of 640 kHz results in relative offset of 0.5×10-6 from the current CODATA value of k, and type A relative standard uncertainty of 23×10-6. The quadratic fitting parameters of the ratio spectrum show a flat response with respect to the measurement bandwidth. This flat response is a dramatic improvement compared to the response produced by the NIST JNT system that dominated the relative combined uncertainty of previous measurements of k.
  • Keywords
    calibration; constants; frequency response; thermal noise; thermometers; Boltzmann constant k; CODATA; Johnson noise thermometer; NIM; NIST JNT system; bandwidth 640 kHz; calibration; electrical noise power; electronic measurement; flat frequency response; quadratic fitting parameters; ratio spectrum; relative standard uncertainty; thermal noise power; Bandwidth; Fitting; Frequency measurement; Measurement uncertainty; Noise; Transmission line measurements; Uncertainty; Boltzmann constant; Correlation; Josephson junction arrays; Noise; Quantization; Thermometry;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements (CPEM), 2012 Conference on
  • Conference_Location
    Washington, DC
  • ISSN
    0589-1485
  • Print_ISBN
    978-1-4673-0439-9
  • Type

    conf

  • DOI
    10.1109/CPEM.2012.6250879
  • Filename
    6250879