• DocumentCode
    274762
  • Title

    MOVPE grown (Hg, Cd)Te layers for room temperature operating 3-5 μm photoconductive detectors

  • Author

    Druilhe, R. ; Lorans, D. ; Flachet, J.C. ; Katty, A. ; Triboulet, R. ; Duy, T.Nguyen

  • Author_Institution
    Lab. de Phis des Solides de Bellevue, CNES, Paris, France
  • fYear
    1990
  • fDate
    5-7 Jun 1990
  • Firstpage
    20
  • Lastpage
    24
  • Abstract
    Hg1-xCdxTe (MCT) is the leading material in IR detection. In the aim of extending the IR application field of MCT, the lowest possible cost is required. A first approach is to minimize the cooling requirements in operating at temperatures >200 K, allowing the use of thermoelectric coolers. Photoconductors in the 3-5 μm wavelength window can be operated in a temperature range higher than photodiodes which must be cooled down to 77 K. The use of substrates such as GaAs, with the possibility of electronic integration and of vapor epitaxial techniques such as MBE and MOVPE, is considered. The authors report on the growth, characterization and detector measurements on MOVPE grown Hg0.7Cd0.3Te
  • Keywords
    II-VI semiconductors; III-V semiconductors; cadmium compounds; gallium arsenide; infrared detectors; mercury compounds; photodetectors; semiconductor epitaxial layers; semiconductor growth; substrates; vapour phase epitaxial growth; 200 K; 293 K; 3 to 5 micron; GaAs; Hg0.7Cd0.3Te-GaAs; II-VI semiconductors; III-V semiconductors; IR detector; MOVPE; cooling; cost; photoconductive detectors; room temperature; semiconductor growth;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Advanced Infrared Detectors and Systems, 1990., Fourth International Conference on
  • Conference_Location
    London
  • Print_ISBN
    0-86341-702-7
  • Type

    conf

  • Filename
    98649