• DocumentCode
    2748171
  • Title

    SVM multiple non-linear regression for moisture content detecting

  • Author

    Yang, Guohui ; Wu, Qun ; Jiang, Yu

  • Author_Institution
    Sch. of Electron. & Inf. Technol., Harbin Inst. of Technol., Harbin
  • fYear
    2008
  • fDate
    13-16 July 2008
  • Firstpage
    103
  • Lastpage
    107
  • Abstract
    A method for regression of non-linear relations between resonance parameters and moisture content is employed in order to eliminate the measurement errors. A multiple non-linear regression model based on support vector machine(SVM) is built. Then, the eigenvalue and contribution degree of resonance frequency, quality factor and environment temperature are calculated. Experiments are employed by SVM-KM toolbox with 50 group data for training model and 15 group data for verifying model performance. The result showed the arithmetic not only has the ability to realize the moisture soft-sensor using microwave coaxial but also has the advantage in dealing with fewer samples compared with BP neural network algorithm. The root mean square relatively error, mean absolute relatively error and maximize absolute relatively error of SVM model generalization performance are 1.06%, 0.96% and 1.16%, respectively.
  • Keywords
    Q-factor; backpropagation; eigenvalues and eigenfunctions; mean square error methods; neural nets; nonlinear equations; regression analysis; support vector machines; BP neural network algorithm; SVM multiple nonlinear regression; SVM-KM toolbox; mean absolute relatively error; microwave coaxial; moisture content detection; moisture soft-sensor; quality factor; resonance parameters; root mean square relatively error; support vector machine; Arithmetic; Coaxial components; Eigenvalues and eigenfunctions; Measurement errors; Moisture; Q factor; Resonance; Resonant frequency; Support vector machines; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Informatics, 2008. INDIN 2008. 6th IEEE International Conference on
  • Conference_Location
    Daejeon
  • ISSN
    1935-4576
  • Print_ISBN
    978-1-4244-2170-1
  • Electronic_ISBN
    1935-4576
  • Type

    conf

  • DOI
    10.1109/INDIN.2008.4618075
  • Filename
    4618075