• DocumentCode
    2748380
  • Title

    Modeling technique for down-state of RF MEMS phase shifter based on artificial neural network

  • Author

    Yang, G.H. ; Wu, Q. ; Fu, J.H. ; Tang, K. ; He, J.X.

  • Author_Institution
    Sch. of Electron. & Inf. Technol., Harbin Inst. of Technol., Harbin
  • fYear
    2008
  • fDate
    13-16 July 2008
  • Firstpage
    176
  • Lastpage
    180
  • Abstract
    A modeling technique based on RBF neural network is presented for the design of RF MEMS phase shifter. Three sensitive parameters are selected according to complicated three-dimensional structure design of an RF MEMS phase shifter and used as inputs of neural network. Experiments show that the proposed approach in this paper is a high efficiency modeling for the RF characteristics analysis for down-state of RF MEMS phase shifter. The training of the RBF neural network is accomplished within 1 hour using 27*51 samples. The trained RBF neural network is able to predict the outputs for 51 test samples within 1 minute. Comparison between RBF neural network predictions and HFSS simulations show that the root mean square relatively errors, mean absolute relatively errors and maximize absolute relatively errors are less than 0.0378, 0.0427 and 0.0449 respectively.
  • Keywords
    micromechanical devices; neural nets; phase shifters; radial basis function networks; HFSS simulations; RBF neural network; RF MEMS phase shifter; artificial neural network; maximize absolute relatively errors; mean absolute relatively errors; root mean square relatively errors; time 1 hour; time 1 min; Artificial neural networks; Bridge circuits; Insertion loss; Micromechanical devices; Millimeter wave radar; Millimeter wave technology; Neural networks; Phase shifters; Radiofrequency microelectromechanical systems; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Informatics, 2008. INDIN 2008. 6th IEEE International Conference on
  • Conference_Location
    Daejeon
  • ISSN
    1935-4576
  • Print_ISBN
    978-1-4244-2170-1
  • Electronic_ISBN
    1935-4576
  • Type

    conf

  • DOI
    10.1109/INDIN.2008.4618089
  • Filename
    4618089