SIM.EM-K4 10 pF capacitance comparison summary

Author

Koffman, A. ; Zhang, N.F. ; Wang, Y. ; Shields, S. ; Wood, B. ; Kochav, K. ; Moreno, J.A. ; Sanchez, H. ; Castro, B.I. ; Cazabat, M. ; Ogino, L.M. ; Kyriazis, G. ; Vasconcellos, R.T.B. ; Slomovitz, D. ; Izquierdo, D. ; Faverio, C.

fYear

2012

fDate

1-6 July 2012

Firstpage

398

Lastpage

399

Abstract

A key comparison of capacitance has been carried out by the Inter-American Metrology System (SIM) Regional Metrology Organization (RMO). The purpose is to establish the degree of equivalence of capacitance between the national metrology institutes (NMIs) within SIM, in support of the International Committee for Weights and Measures (CIPM) Mutual Recognition Agreement (MRA). The key comparison artifact is a 10 pF commercial fused-silica standard capacitor. Seven SIM NMIs participated in the comparison. Results linking the SIM.EM-K4 to CCEM-K4 will show agreement of SIM NMIs to other RMOs.

Keywords

capacitance measurement; capacitors; silicon compounds; CCEM-K4; CIPM; International Committee for Weights and Measures; MRA; Mutual Recognition Agreement; NMI; National Metrology Institute; RMO; Regional Metrology Organization; SIM.EM-K4; SiO₂; capacitance 10 pF; capacitance comparison summary; commercial fused-silica standard capacitor; interAmerican metrology system; key comparison artifact; Atmospheric measurements; Capacitance; Ice; NIST; Particle measurements; Uncertainty; Capacitance measurements; comparison linkage; key comparison; measurement comparison; standard capacitor; uncertainty;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements (CPEM), 2012 Conference on

Conference_Location

Washington, DC

ISSN

0589-1485

Print_ISBN

978-1-4673-0439-9

Type

conf

DOI

10.1109/CPEM.2012.6250971

Filename

6250971