DocumentCode
2749579
Title
The comparison of electric field intensity effects to the bean sprouts growing
Author
Kiatgamjorn, P. ; Khan-ngern, Werachet ; Nitta, S.
Author_Institution
Fac. of Eng., King Mongkut´s Inst. of Technol., Bangkok, Thailand
fYear
2003
fDate
4-7 Nov. 2003
Firstpage
142
Lastpage
147
Abstract
The electric field intensity is varied at 10, 20, 25 kV/m. This paper is focused on the height of stems and the length of roots. The effect of electric field intensity is evaluated on bean sprout growing. The electric field intensity is analyzed by the finite element method. Experimental results indicate that the bean sprout in high electric field intensity has a better growth in comparison with that of low electric field based on statistical analysis.
Keywords
agriculture; biological effects of fields; crops; electric field effects; finite element analysis; bean sprout growing; electric field intensity effects; finite element method; root length; statistical analysis; stem height; Electric fields; Electric variables measurement; Electrodes; Equations; Finite element methods; Length measurement; Measurement standards; Plastics; Statistical analysis; Statistics;
fLanguage
English
Publisher
ieee
Conference_Titel
Environmental Electromagnetics, 2003. CEEM 2003. Proceedings. Asia-Pacific Conference on
Conference_Location
Hangzhou, China
Print_ISBN
7-5635-0802-3
Type
conf
DOI
10.1109/CEEM.2003.238651
Filename
1282264
Link To Document