Electromagnetic near field distribution measurements using optically scanning system

Author

Takahashi, Masanori ; Kawasaki, Katsumi ; Ohba, Hiroyasu ; Ikenaga, Tomokazu ; Orikasa, Tatsuru ; Ishiyama, Kazushi ; Adachi, Nobuyasu ; Ota, Hiroyasu ; Arai, Ken Ichi

Author_Institution

Sendai Res. Center, Nat. Inst. of Inf. & Commun. Technol., Sendai, Japan

fYear

2009

fDate

11-12 June 2009

Firstpage

1

Lastpage

4

Abstract

An optically scanning electromagnetic field probe system, consisting of an electro-optic or magneto-optic crystal substrate and a galvano scanner, has been developed for the high speed, low-invasive measurement of electromagnetic near field distribution. We present some examples of electromagnetic field distribution measurements above a microstrip line using a LiNbO₃ or a magnetic garnet crystal substrate and the probe system. We have also measured electromagnetic fields above a commercially available IC using the system.

Keywords

electric field measurement; electro-optical effects; electromagnetic fields; lithium compounds; magneto-optical effects; microstrip lines; niobium compounds; optical scanners; IC; LiNbO₃; electro-optic crystal substrate; electromagnetic near field distribution measurements; galvano scanner; magnetic garnet crystal substrate; magneto-optic crystal substrate; optically scanning electromagnetic field probe system; Antenna measurements; Electromagnetic fields; Electromagnetic measurements; Fiber lasers; High speed optical techniques; Laser beams; Magnetic field measurement; Magnetic materials; Optical beams; Probes; Electromagnetic field; electro-optic effect; galvano scanner; magneto-optic effect;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility - EMC Europe, 2009 International Symposium on

Conference_Location

Athens

Print_ISBN

978-1-4244-4107-5

Electronic_ISBN

978-1-4244-4108-2

Type

conf

DOI

10.1109/EMCEUROPE.2009.5189722

Filename

5189722