SIM.EM-S5 voltage, current and resistance comparison

Author

Sanchez, Harold ; Cioffi, Jorge ; Kyriazis, Gregory ; Ramos, Rodrigo ; Martinez, Alexander ; Montaluisa, Julio ; Gonzalez, Julio ; Postigo, Henry ; Hamilton, Francis ; Elmquist, Rand ; Zhang, Nien-fan ; Izquierdo, Daniel

fYear

2012

fDate

1-6 July 2012

Firstpage

566

Lastpage

567

Abstract

This paper reports the results of the second Interamerican Metrology System (SIM) comparison on calibration of digital multimeters, performed for strengthening the interaction among National Metrology Institutes (NMIs) and for establishing the degree of equivalence between those laboratories in accordance with the CIPM Mutual Recognition Agreement. From June 2007 to October 2009, four multimeters were used as traveling standards for measurements in eleven countries, with NIST-USA acting as pilot laboratory. Results for nine measurement points are presented as errors relative to a comparison reference value together with their uncertainty.

Keywords

calibration; electric current measurement; electric resistance measurement; measurement uncertainty; multimeters; voltage measurement; CIPM mutual recognition agreement; Interamerican Metrology System; NIST-USA; NMI; National Metrology Institutes; SIM.EM-S5; digital multimeter calibration; measurement points; pilot laboratory; Atmospheric measurements; Humidity measurement; Measurement uncertainty; Particle measurements; Standards; Temperature measurement; Uncertainty; Comparison; measurement error; measurement uncertainty; multimeter;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements (CPEM), 2012 Conference on

Conference_Location

Washington, DC

ISSN

0589-1485

Print_ISBN

978-1-4673-0439-9

Type

conf

DOI

10.1109/CPEM.2012.6251055

Filename

6251055