Parameterizable testing scheme for FIR filters

Author

Mukherjee, Nilanjan ; Rajski, Janusz ; Tyszer, Jerzy

Author_Institution

Eng. Res. Center, Lucent Technol., Princeton, NJ, USA

fYear

1997

fDate

1-6 Nov 1997

Firstpage

694

Lastpage

703

Abstract

This paper presents a new pseudo-exhaustive test methodology for digital finite impulse response (FIR) filters. The proposed scheme can be employed in a built-in self-test (BIST) environment to detect any combinational faults occurring in linear phase comb filters, trees of sign-extended adders and phase-shift multipliers. It uses additive generators as a source of pseudo-exhaustive patterns to test systematically all FIR filter building blocks

Keywords

FIR filters; adders; built-in self test; combinational circuits; logic testing; multiplying circuits; FIR filters; built-in self-test environment; combinational faults; digital finite impulse response; linear phase comb filters; phase-shift multipliers; pseudo-exhaustive patterns; pseudo-exhaustive test methodology; sign-extended adders; Adders; Built-in self-test; Digital filters; Fault detection; Finite impulse response filter; Impulse testing; Nonlinear filters; Phase detection; System testing; Test pattern generators;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1997. Proceedings., International

Conference_Location

Washington, DC

ISSN

1089-3539

Print_ISBN

0-7803-4209-7

Type

conf

DOI

10.1109/TEST.1997.639682

Filename

639682

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2751393