Capacitive and inductive couplings of PCB traces

In an electrical and electronic system, performance degradation may occur due to crosstalk. This paper outlines the modeling and analysis of crosstalk pertaining to PCB traces: reactive and radiated. Each crosstalk needs different modeling technique due to their different nature. From the model, parameters that contribute to the crosstalk can be identified. Plots of crosstalk response due to variation in separation distance of the traces, height of traces from ground plane, and source-load impedance are displayed and discussed. Special needs to overcome near-field coupling such as shielding are highlighted. There is resonance in the response of the crosstalk at high frequencies (□/λ≫1, where □ is the length of a trace and λ is the signal wavelength) due to near-field radiation coupling. This paper identifies the critical parameters that dampen the resonance. The results shown in this paper can be used by circuit designers to reduce the effect of crosstalk especially at high frequency